
Clay fractions analyzed include Mg saturated, Water and glycerol, and K saturated and heated 25, 100, and 500 degrees C specimen. Most samples were prepared by the filter peel technique. A few had to be placed on slides from dilute suspensions.
XRD analysis was done on a Siemens D5000 unit with a Cu tube. Scans were from 2 to 36 degrees 2-theta, 3-second counts at 0.05 degree steps. The patterns are plotted using the unedited, raw ascii files.
All samples were Mg and K saturated and mounted on slides in the University of Florida mineralogy laboratory. XRD analysis were obtained in the Mineral Analysis Laboratory at Auburn University. The online database was designed and programmed at ALRICand the Soil Physics Laboratory at Auburn University.
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